Browsing by author "Davila, Abundio"

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Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis

Fernández Álvarez, Antonio; Fernández Doval, Ángel Manuel; Davila, Abundio; Blanco García, Jesús; Pérez López, Carlos; Fernández Fernández, José Luis
conferenceObject
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Measurement of transient out-of-plane displacement gradients in plates using double-pulsed subtraction TV shearography

Fernández Álvarez, Antonio; Fernández Doval, Ángel Manuel; Kaufmann, G. H; Davila, Abundio; Blanco García, Jesús; Pérez López, Carlos; Fernández Fernández, José Luis
article
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