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dc.contributor.authorFernández Álvarez, Antonio
dc.contributor.authorFernández Doval, Ángel Manuel 
dc.contributor.authorBugarín Diz, Javier
dc.contributor.authorVázquez Dorrío, José Benito 
dc.contributor.authorLópez Vázquez, José Carlos 
dc.contributor.authorAlén de la Torre, José María
dc.contributor.authorBlanco García, Jesús 
dc.contributor.authorPerez-Martinez Perez-Amor, Mariano Jesus 
dc.contributor.authorFernández Fernández, José Luis 
dc.contributor.editorSPIEspa
dc.date.accessioned2019-04-26T09:39:41Z
dc.date.available2019-04-26T09:39:41Z
dc.date.issued1997-07-04
dc.identifier.urihttp://hdl.handle.net/11093/1236
dc.description.abstractIn this paper we demonstrate the feasibility of impact-induced transient deformations measurement by single-pulsed subtraction TV holography an the Fourier transform method with contouring fringes as spatial carrier. Fringe formation in single-pulsed subtraction TV holography and phase demodulation by the Fourier transform method are descried. Contouring fringes are proved to be well suited for introducing spatial carrier in the correlation fringe patterns. Experimental results are presented. Finally, the degree of immunity to environmental disturbances of this technique is discussed and improvements are proposed.spa
dc.description.sponsorshipComisión Interministerial de Ciencia y Tecnología | Ref. TAP-263/93spa
dc.description.sponsorshipXunta de Galicia | Ref. XUGA 32105B92spa
dc.description.sponsorshipUniversidade de Vigospa
dc.description.sponsorshipTECNATOM S.A.spa
dc.description.sponsorshipIberdrola S.A.spa
dc.language.isoengspa
dc.titleTransient bending wave analysis by Fourier evaluation of single-pulsed TV holography fringe patternsspa
dc.typeconferenceObjectspa
dc.rights.accessRightsopenAccessspa
dc.identifier.doi10.1117/12.281206
dc.identifier.editorhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=928207spa
dc.publisher.departamentoDeseño na enxeñaríaspa
dc.publisher.departamentoFísica aplicadaspa
dc.conferenceObject.typeComunicación extensa internacionalspa
dc.identifier.conferenceObject"Optical Inspection and Micromeasurements II" - Lasers and Optics in Manufacturing III, Munich, Alemania, 16-20 junio 1997spa
dc.publisher.grupoinvestigacionXeotecnoloxías Aplicadasspa
dc.publisher.grupoinvestigacionGrupo de Óptica Físicaspa
dc.subject.unesco3311.11 Instrumentos Opticosspa
dc.subject.unesco2209.07 Holografíaspa
dc.subject.unesco2201.11 Vibracionesspa
dc.date.updated2019-04-24T17:03:38Z


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