A systematic investigation of admittance domain behavioral model complexity requirements
UNIVERSAL IDENTIFIER: http://hdl.handle.net/11093/3509
EDITED VERSION: https://ieeexplore.ieee.org/document/8699054/
UNESCO SUBJECT: 3307.08 Dispositivos de Microondas ; 3307.14 Dispositivos Semiconductores ; 3307.92 Microelectrónica. Tecnologías III-V y Alternativas
DOCUMENT TYPE: conferenceObject
Non-linear frequency-domain I-V behavioral models have recently been proposed as an alternative to A-B behavioral models. Admittance formulation is suitable for model scaling with device size and fundamental frequency, very convenient for MMICs CAD. But direct extraction from NVNA measurements, easy to perform with A-B models, is difficult, since we need to account for input variations. Hence determining the required model complexity to aid in the extraction/modelling process becomes a key issue. In this paper, a systematic investigation of the Admittance model complexity requirements to obtain sufficiently accurate model predictions suitable for microwave power amplifier design requirements, is performed.
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