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dc.contributor.authorGomes, Hugo
dc.contributor.authorRodríguez Testera, Alejandro 
dc.contributor.authorCarvalho, Nuno Borges
dc.contributor.authorFernández Barciela, Mónica 
dc.contributor.authorRemley, Kate A
dc.date.accessioned2022-06-03T11:03:09Z
dc.date.available2022-06-03T11:03:09Z
dc.date.issued2011-04
dc.identifier.citationIEEE Transactions on Microwave Theory and Techniques, 59(4): 987-997 (2011)spa
dc.identifier.issn00189480
dc.identifier.issn15579670
dc.identifier.urihttp://hdl.handle.net/11093/3522
dc.description.abstractIn this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We show analytically, by simulations, and with measurements, that commonly used single-tone calibration procedures for diode power probes can provide erroneous values when measuring modulated signals used in many new wireless standards. We show that high values of peak-to-average-power ratio can degrade the calibration results due to the low-frequency response imposed by the power probe’s baseband circuit impedance. This effect is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements with a diode power probe circuit. This study provides engineers with guidelines for techniques for correction of diode power probe measurements.spa
dc.description.sponsorshipMinisterio de ciencia e innovación | Ref. HP2006-0120spa
dc.description.sponsorshipMinisterio de Ciencia e Innovación | Ref. TEC2008-06874-C03-02spa
dc.description.sponsorshipXunta de Galicia | Ref. INCITE08PXIB322241PRspa
dc.language.isoengspa
dc.publisherIEEE Transactions on Microwave Theory and Techniquesspa
dc.relationinfo:eu-repo/grantAgreement/MICINN//TEC2008-06874-C03-02/ES/METODOLOGIA DE DISEÑO OPTIMIZADO DE ARRAYS DE OSCILADORES BI-DIMENSIONALES PARA APLICACIONES DE CONTROL DE APUNTAMIENTO DE ANTENAS ¿PHASED-ARRAY?
dc.relationinfo:eu-repo/grantAgreement/MEC//HP2006-0120/ES/LARGE SIGNAL MEASUREMENTS FOR NONLINEAR BEHAVIORAL MODEL EXTRACTION
dc.titleDiode power probe measurements of wireless signalsen
dc.typearticlespa
dc.rights.accessRightsopenAccessspa
dc.identifier.doi10.1109/TMTT.2010.2100405
dc.identifier.editorhttp://ieeexplore.ieee.org/document/5696790/spa
dc.publisher.departamentoTeoría do sinal e comunicaciónsspa
dc.publisher.grupoinvestigacionGrupo de Dispositivos de Alta Frecuenciaspa
dc.subject.unesco3307.08 Dispositivos de Microondasspa
dc.subject.unesco3307.14 Dispositivos Semiconductoresspa
dc.subject.unesco3307.92 Microelectrónica. Tecnologías III-V y Alternativasspa
dc.date.updated2022-05-24T17:00:18Z
dc.references© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.spa


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