Diode power detector X‐parameters™ model extraction using LSNA‐based measurement system

Abstract

A study is presented on the problems that may arise when characterising low frequency device behaviour with a large signal network analyser (LSNA)-based measurement system. A diode power detector has been measured and, for the first time, an X-parameters based detector model was extracted from measurements. Difficulties measuring the detector output voltage dependence with baseband impedances, especially when those impedances showed resonant effects, were observed and a method to overcome the problems encountered is presented. The measurement-based detector X-parameters model demonstrated its usefulness to predict power detector behaviour under two-tone excitations and complex loads.