TY  - GEN 
AU  - Fernández Fernández, José Luis
AU  - López Vázquez, José Carlos
AU  - Trillo Yáñez, María Cristina
AU  - Fernández Doval, Ángel Manuel
PY  - 2012
UR  - http://hdl.handle.net/11093/213
AB  - Inspection  of  optically  rough  
surfaces  in  search  of  defects  or  other  surface  features  with  deterministic  reflectance  
distributions  is  a  subject  well  suited  to  optical  techniques.  We  present  a  device  with  episcopic ...
LA  - eng
TI  - Episcopic coaxial illumination device for the simultaneous recording of the speckle signature in the spectrum and in the image of scattering reflective surfaces
DO  - 10.1117/12.978075
ER  -